基于共焦显微条件下线结构光共焦显微术的研究  

Research on Confocal Microscopy of Line Structure Light based on Confocal Microscopy

作　　者：萧泽新[1] 韩文峰[1] 

机构地区：[1]桂林电子科技大学光机电一体化研究所,广西桂林541004

出　　处：《装备制造技术》2010年第3期1-2,5,共3页Equipment Manufacturing Technology

基　　金：广西制造系统与先进制造技术重点实验室开放基金项目(桂科能07109008_026_K)

摘　　要：美国的Minsky在20世纪50年代末提出共焦显微术的概念以来,尽管共焦显微术可以获得更高的分辨率,但不仅成像速度慢,而且需要使用光电增强器对采集光点信号进行增强,导致制造成本过高,所以除一些成像质量要求极高的显微系统外,其他的显微系统很少应用。讨论了线结构光共焦显微术的原理、优缺点以及影响性能的几个重要因素,并介绍其最新的研究状况。The concept of confocal microscopy was first proposed by American scientist Minsky in the late 1950s. Though the confoeal microscopy can get a better resolution, except the microscope system with requirements of very high imaging quality, other microscope systems seldom use it because of the slow imaging speed and requirements of the collected spot signal enhancement by photoelectric intensifier. The principle of the eonfocal microscopy of line structure light was discussed, and its latest research situation was presented.

关 键 词：线共焦 线扫描 线结构光 

分 类 号：TH742[机械工程—光学工程]