SiCw/6061Al复合材料X射线应力测量中定峰方法研究  

An investigation on the peak location method of X-ray stress analysis of SiCw/606lAl composites

作　　者：姜传海[1] 李寰[2] 王德尊[1] 王中光 

机构地区：[1]哈尔滨工业大学,哈尔滨150001 [2]中科院金属所疲劳与断裂国家重点实验室

出　　处：《物理测试》1998年第3期37-39,共3页Physics Examination and Testing

基　　金：国家自然科学基金;59381002;59381003

摘　　要：本文借助X-射线应力仪,采用半高宽中点及高斯曲线定峰方法,测量SiCw/6061A1复合材料基体中的热错配应力,结果表明,高斯曲线具有较高的定峰精度,是复合材料X-射线应力测量中的理想定峰方法。With a X -ray stress analyser, the thermal misfit stress in matix of SiCw/6061Al composites was measured by the half-value breadth centre method and Gauss curve method of X -ray diffraction peak location. The result shows that, the Gauss curve has high accuracy for peak location, is the best peak location method in X -ray stress analysis.

关 键 词：复合材料 定峰方法 应力测量 铝基 碳化硅 

分 类 号：TB333.02[一般工业技术—材料科学与工程]