检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:沈兆侠[1] 陈荣发[1] 戴良刚[1] 朱瑞[1] 张显亮[1]
出 处:《硅酸盐学报》2010年第5期892-896,共5页Journal of The Chinese Ceramic Society
基 金:国家自然科学基金(50605032);江苏省精密与微细制造技术重点实验室开放基金(No.JSPM200705)资助项目
摘 要:在常温和低温下对砷化镓单晶进行压痕实验,分析温度对砷化镓单晶片显微硬度及其裂纹产生和扩展的影响。结果表明:当试验载荷处在低于0.244N的小载荷区时,砷化镓单晶片的显微硬度随着载荷的增加而增大;当载荷处在大于0.244N的高载荷区时,砷化镓单晶片的显微硬度则随载荷的增加而减小。同一载荷下,随着温度的升高,压痕过程中所产生的裂纹长度逐渐增长。在不同温度下,随着载荷的增加,砷化镓单晶片经历了从塑性变形到脆性断裂的转变。减小载荷和降低加工区温度,有利于减少或防止裂纹的产生,使砷化镓的加工处于塑性模态,从而有利于提高加工精度。Indentation experiments on gallium arsenide (GaAs) single crystal were carried out at room and low temperature. The effects of temperature on the micro-hardness, crack initiation and expansion of GaAs single crystal were analyzed. The results show that when the test load was in a small zone less than 0.244 N, the micro-hardness of GaAs increases with the increase of load; when the load was larger than 0.244 N, the micro-hardness decreases with the increase of load. Under the same load, the crack length of GaAs increases with the increase of temperature. At different temperatures, the indentation of GaAs single crystal changes from plastic deformation to brittle fracture with the increase of load. The decrease of load and temperature in the processing region helps to reduce and prevent the crack generation, and also make it possible that the hard and brittle materials such as single-crystal GaAs are processed under the plastic mode, which finally can improve the precise processing.
分 类 号:TB302.3[一般工业技术—材料科学与工程]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:3.137.222.1