n型掺杂层结构对n-i-p型微晶硅电池性能和光致衰退特性的影响  

Influence of n-type layer structure on performance and light-induced degradation of n-i-p microcrystalline silicon solar cells

作　　者：卢鹏[1,2] 侯国付[1] 袁育杰[1] 杨瑞霞[2] 赵颖[1] 

机构地区：[1]南开大学光电子薄膜技术与器件研究所,天津300071 [2]河北工业大学信息工程学院,天津300130

出　　处：《物理学报》2010年第6期4330-4336,共7页Acta Physica Sinica

基　　金：国家重点基础研究发展计划(批准号:2006CB202602;2006CB202603);科学技术部国际科技合作计划(批准号:2009DFA62580);国家高技术研究发展计划(批准号:2009AA050602);天津市国家科技计划配套基金(批准号:07QTPTJC29500)资助的课题~~

摘　　要：采用射频化学气相沉积法,制备了一系列具有不同晶化率n型掺杂层的n-i-p结构微晶硅薄膜太阳电池.发现本征层的结构很大程度上依赖于n型掺杂层的结构,特别是n/i界面处的孵化层厚度以及本征层的晶化率.该系列太阳电池在100mW/cm2的白光下照射400h,实验结果证实了本征层晶化率最大(Xc(i)=65%)的电池性能表现出最低的光致衰退率.拥有非晶/微晶过渡区n型掺杂层的电池(本征层晶化率Xc(i)=54%)分别被白光、红光和蓝光照射,经过400h的光照,发现红光下电池性能仅有2%的衰退,蓝光下衰退率约为8%.A series of n-i-p microcrystalline silicon thin film solar cells with different values of crystalline volume fraction Xc of n-type layers are prepared by radio frequency plasma enhanced chemical vapor deposition. It is found that the structure of intrinsic layer is strongly dependent on the structure of n-type layer,especially the incubation layer thickness at n/i interface and Xc of intrinsic layer. This series of solar cells were light-soaked under 100 mW/cm2 for 400 h. The experiment results demonstrate that the solar cell with the highest Xc of intrinsic layer （ Xc （ i） = 65% ） has the lowest light-induced degradation ratio. Then the solar cell with n-type layer deposited in an amorphous silicon/microcrystalline silicon transition region （Xc（i） = 54% ） is light-soaked under the irradiations of white light,red light and blue light with the same light intensities,separately. After 400 h light-soaking,the light degradation ratio is only 2% for the red light irradiation,while it is 8% for the blue light irradiation.

关 键 词：微晶硅 n-i-p结构太阳电池 光致衰退 晶化率 

分 类 号：TM914.42[电气工程—电力电子与电力传动]