一种时间优化的NoC低功耗测试调度方法  

A time optimized test scheduling method under power constraint for NoC

作　　者：欧阳一鸣[1] 张岚[1] 梁华国[1] 

机构地区：[1]合肥工业大学计算机与信息学院,安徽合肥230009

出　　处：《中国科学技术大学学报》2010年第5期540-545,共6页JUSTC

基　　金：国家自然科学基金(60876028);安徽省自然科学基金(090412034);安徽高等学校自然科学重点项目(KJ2010A269);国家自然科学基金重点项目(60633060)资助

摘　　要：基于NoC重用的测试方法由于受到channel等资源的限制,测试调度问题变的非常复杂.为此提出了一种测试调度方法,综合考虑时间和功耗因素,在所有核并行测试时间最短的前提下,选取总体测试代价最小的I/O端口位置和IP核调度顺序.实验结果表明,本方案有效地降低了NoC的总体测试时间和功耗,提高了并行测试效率.The reuse of on-chip network as a test access mechanism has been proposed to test NoC-Based system recently. However, the test scheduling problem becomes very complex with limited on-chip resources such as channel. An optimized test scheduling method was proposed, which considers both test time and test power. With the premise of reducing the overall test time of all the cores, the location of input^output pairs and the optimized sequence of IP core scheduling during a test were selected according to the minimum cost of all cores. Experimental results show a decrease in test time and overall cost, and an increase in the efficiency during an NoC parallel tests.

关 键 词：片上系统 片上网络 测试调度 测试时间 测试功耗 

分 类 号：TP391.76[自动化与计算机技术—计算机应用技术]