半导体温度计的制作与特性研究  

Making and specific research of semiconductor thermograph

作　　者：符时民[1] 

机构地区：[1]渤海大学物理系,辽宁锦州121013

出　　处：《渤海大学学报（自然科学版）》2010年第2期157-161,共5页Journal of Bohai University:Natural Science Edition

基　　金：辽宁省教育厅科研项目(2008Z005)

摘　　要：对半导体热敏电阻的温度特性进行了研究,确定了半导体电阻的两个性能参数a,b的值,计算出了半导体材料的激活能,得出了各种不同温度下的半导体电阻的温度系数,确定了半导体电阻的经验公式,给出了一元线性回归方程,介绍了制作半导体电阻温度计的方法。The temperature characteristics of the semiconductor resistance are studied, two performance parameter and b of the semiconductor resistance are determined,activation energy of the semiconductor materials is computed, temperature coefficient of the semiconductor resistance is computed under different temperature, emprical formula of the semiconductor resistance are determined, unitary linear regression equation is gived, and ripping method of the semiconductor thermograph is introduced .

关 键 词：半导体温度计 半导体电阻 性能参数 半导体材料的激活能 半导体电阻的温度 系数 回归方程 

分 类 号：O472[理学—半导体物理]