RAM的故障模型及自测试算法  

Fault Model of RAM and Self Detection Method

作　　者：李璇君[1] 辛季龄[1] 张天宏[1] 刘国刚 

机构地区：[1]南京航空航天大学动力工程系

出　　处：《南京航空航天大学学报》1999年第1期48-53,共6页Journal of Nanjing University of Aeronautics & Astronautics

摘　　要：通过对ＲＡＭ故障情况的全面、深入分析，建立了ＲＡＭ的功能故障模型。并在此基础上，提出一种全面、实用的故障自测试算法。该算法分三步完成测试：（１）测试ＲＡＭ中的固定为１（０）故障、固定开路故障、状态转换故障、数据保持故障及第一类耦合故障中的不相关耦合等故障；（２）测试第一类耦合故障中的相关耦合故障；（３）测试第二类耦合故障。对ＲＡＭ的故障注入试验验证了该算法的有效性。并将此算法应用于航空电子模拟器的ＢＩＴ（Ｂｕｉｌｔｉｎｔｅｓｔ）的设计中。The functional fault model of RAM is established by the comprehensive and deep analysis of the RAM′s fault conditions. On the basis of the above work, a comprehensive and practical self detection method is put forward. The experimental procedure is divided into three steps: (1) The stuck at 1(0) fault,stuck at open fault, transiton fault,data maintaining fault and the noninteracting coupling fault belonged to the first kind of coupling fault, etc are detected; (2) The interacting coupling fault belonged to the first kind of coupling fault is detected; (3) The second kind of coupling fault is detected. By the means of fault injection experiment, the method is proved to be successful and effective, and is applied to the BIT(Built in tests) design of the avionic simulator.

关 键 词：故障检测 故障模型 耦合故障 自测试算法 RAM 

分 类 号：TP333.8[自动化与计算机技术—计算机系统结构]