ICP-AES法同时测定纯铁中八种杂质元素  

Simultaneous Determination of Eight Impurity Elements in Pure Iron by ICP AES

作　　者：赵玉珍[1] 薛进敏[1] 

机构地区：[1]中国科学院物理研究所

出　　处：《光谱实验室》1999年第1期79-82,共4页Chinese Journal of Spectroscopy Laboratory

摘　　要：本文研究了用ＩＣＰ－ＡＥＳ法同时测定纯铁中８种杂质元素：Ｃｒ、Ｃｕ、Ｍｇ、Ｍｎ、Ｍｏ、Ｎｉ、Ｔｉ、Ｖ的分析方法。研究了铁基体元素对被测元素光谱线的光谱干扰与物理干扰，采用背景扣除法与基体匹配法进行校正。被测元素的检出限为０．４－３．０μｇ／Ｌ，合成试样的回收率为９１％－１１０％，杂质元素含量为０．０００３％－０．０５％时，测量的相对标准偏差＜９％。方法简便、准确、结果满意。A method has been studied for simultaneous determination of eight impurity elements Cr,Cu,Mg,Mn,Mo,Ni,Ti and V in pure iron by ICP AES.The spectral interference and physical interference from Fe to the spectral lines of the elements determined are investigated and corrected by the matrix maching and background correction methods. The detection limits determined elements are 0.4-3.0μg/L ,the recoveries are 91%-110%,the relative standard deviations are less than 9% for impurity elements content 0.0003%-0.05%.The method is simple and accurate, and has been used to the analysis of pure iron with satisfactory results.

关 键 词：ICP AES 纯铁 铬 铜 镁 锰 钼 镍 钛 钒 杂质 

分 类 号：TG143[一般工业技术—材料科学与工程]