不同牙本质粘结系统处理后的牙釉质表面及粘结界面扫描电镜观察  

Surface topography and morphological characteristics of enamel/adhesive interfaces

作　　者：宣玮[1] 侯本祥[2] 臧滔[1] 

机构地区：[1]首都医科大学附属北京安贞医院口腔科,100029 [2]首都医科大学口腔医学院牙体牙髓科

出　　处：《北京口腔医学》2010年第3期138-140,共3页Beijing Journal of Stomatology

基　　金：国家"十一五"科技支撑计划课题(2007BAI18B01);国家自然科学基金(30872877)

摘　　要：目的观察不同牙本质粘结系统处理牙釉质后,牙釉质表面和粘结界面的超微结构特点。方法选取人离体下第三磨牙14颗,湿性打磨颊面牙釉质。随机选择6颗牙,分别使用全酸蚀牙本质粘结系统AdperTMSingleBond2(SB2)、一步法自酸蚀牙本质粘结系统ClearfilS3Bond(CS3)和iBondGI(IB)与光固化复合树脂粘结牙釉质。硬组织切片,扫描电镜观察各粘结系统与牙釉质粘结界面形态特点。另8颗牙,随机分4组,对照组不再做任何处理,另3组分别用SB2的酸蚀剂(35%磷酸)、CS3和IB处理牙釉质表面,扫描电镜观察牙釉质表面形态特点。结果 SB2的酸蚀剂酸蚀牙釉质表面后,脱矿明显,形成典型的蜂窝状结构;SB2粘结剂在牙釉质粘结界面形成密集的树脂突,长约5μm;CS3和IB对牙釉质的脱矿较弱,与牙釉质粘结界面无明显的树脂突形成。结论自酸蚀粘结系统CS3和IB与牙釉质粘结界面的超微结构和全酸蚀粘结系统SB2相比较存在明显差异。Objective To examine the surface topography and morphology of the enamel and enamel-adhesive interface after treatment by different bonding systems.Methods The buccal enamel surface of 14 teeth was ground flat.One etch-and-rinse adhesive Adper^TM Single Bond 2（SB2）,two one-step self-etching adhesives Clearfil S^3 Bond（CS3）,i Bond GI（IB）were bonded to 6 teeth,and cross-sections were then obtained.The conditioner of SB2（H3PO4）,CS3 and IB was applied to the ground enamel surfaces.SEM（Hitachi S-4800）was used to evaluate the morphology of the enamel surface and the enamel-adhesive interface.Results Enamel decalcification was obvious and honeycomb structure formed after etching by SB2,providing sufficient enamel-resin hybridization in ground enamel.CS3 and IB caused less decalcification than SB2.Conclusion The etching pattern and adhesive penetration of self-etching adhesives CS3 and IB are different from that of etch-and-rinse adhesive SB2.

关 键 词：牙本质粘结系统 牙釉质 扫描电镜 

分 类 号：R783[医药卫生—口腔医学]