高频硫氮共渗层的剥层X射线衍射分析  

X-ray Diffraction Analysis of High Frequency Sulfouilriding Layers

作　　者：亓永新[1] 李木森[1] 徐英[1] 王培福 

机构地区：[1]山东工业大学材料科学与工程学院,济南250061 [2]济南锅炉压力容器检验所

出　　处：《物理测试》1999年第2期24-25,共2页Physics Examination and Testing

摘　　要：本文利用X射线衍射仪对高频硫氮共渗层的相结构进行了分析,发现渗层表层部位主要由FeS、Fe_3O_4及ζ-Fe_2N等相组成,中间白亮层为ζFe_2N+ε-Fe_3N,扩散层由α-Fe+ε-Fe_(2-3)N等组成。The high freguency sulfonitriding layers has been characterized by using X-ray diffraction method in this paper. The result showed that the surface layer included FeS、 Fe3O4 and ξ-Fe2N phases, the middle nitrided region were ξ-Fe2N 、and ε-Fe3N, the inner diffusion rgion were α-Fe and ε-Fe2-3N.

关 键 词：硫氮共渗 相结构 X射线衍射分析 渗层 

分 类 号：TG156.8[金属学及工艺—热处理] TG115.23[金属学及工艺—金属学]