基于确定模式的伪单跳变测试矢量生成技术  

Pseudo-single-change test pattern generation technique based on deterministic model

作　　者：刘建军[1] 李铁军[1] 邹立明 

机构地区：[1]集美大学信息工程学院,福建厦门361021 [2]上海普阅信息科技有限公司,上海201203

出　　处：《电子技术应用》2010年第9期104-107,共4页Application of Electronic Technique

摘　　要：提出了一种基于确定模式的伪单跳变测试矢量生成方法,它是在折叠计数器确定模式的基础上,采用LFSR编码折叠计数器种子,通过选定的存储折叠距离来控制测试模式,使得产生的测试矢量之间实现伪单跳变。由于是在确定模式基础上进行的研究,没有改变原来的测试矢量,所以故障覆盖率不会改变,却大大降低了测试功耗。这样既保证了高故障覆盖率,又解决了不同种子所生成的测试矢量之间的重叠冗余。研究结果不仅表明该方案具有很好的数据压缩率,而且证明了该方案的有效性。In this paper, a new pseudo-single-change test pattern generation technique is proposed. The new technique using the folding counter and linear feedback shift register encoding folding seed, after that by selecting folding distance to achieve the pseudo-single transition of test vectors. Because it is carried out based on deterministic model, the original test vectors are not changed, so the fault coverage has not changed, but it greatly reduces the test power consumption. Therefore not only guarantees a high coverage but also solve the seed vectors＇ overlap and redundant. The results show that the new technique has good data com- pression ratio and fault coverage ratio. Experiment proves it have a stron~ oractical.

关 键 词：低功耗设计 折叠矢量 伪单跳变 确定模式 种子 

分 类 号：TN407[电子电信—微电子学与固体电子学]