小波分析在IC I_(DDT)弱故障定位研究中的应用  

Application of Wavelete Analysis in the IC I_(DDT) Weak Fault Location Research Field

作　　者：焦慧芳[1] 贾新章[2] 

机构地区：[1]西安电子科技大学微电子所,西安710071 [2]工业和信息化部电子五所,广州510610

出　　处：《计算机与数字工程》2010年第9期5-8,共4页Computer & Digital Engineering

摘　　要：针对IC中的弱故障进行了瞬态电流IDDT研究,发现IDDT信号中带有弱故障信息,在此基础上应用小波分析技术对弱故障IDDT进行了故障定位研究,提取出电路的故障特征参数Td,为实现弱故障定位进行了有益地探索。This paper focused on the transient current IDOT of IC with weak fault, and found the IDOT signal carring the information of weak fault. Based on the fact the application of wavelete analysis in the fault location for the IDOT with weak fault of IC was researched. By using the wavelete analysis for IDOT signal, the fault characteristics Td was extracted. All of this is a beneficial exploring for weak fault location of IC.

关 键 词：弱故障 瞬态电流IDDT 故障定位 小波分析 故障特征参数 

分 类 号：TM93[电气工程—电力电子与电力传动]