单片机测试向量生成技术研究  

Test Pattern Generating Technology Research for Microcontroler

作　　者：胡勇[1] 李轩冕[1] 贺志容[1] 

机构地区：[1]武汉数字工程研究所,武汉430074

出　　处：《计算机与数字工程》2010年第9期90-92,150,共4页Computer & Digital Engineering

摘　　要：集成电路测试是保证产品质量的重要手段,如何检测MCU类复杂大规模集成电路是测试的难点。文章分析了目前单片机测试向量获取的几种方法,并在此基础上提出了一种单片机测试向量生成的新方法,通过将单片机测试向量分成测试激励和测试响应两部分,测试激励部分通过编写专用脚本软件将汇编程序转换成ATE专用测试向量,测试响应部分的测试向量则通过ATE的匹配功能来完成,从而成功地实现了对单片机的测试。IC test is the most important method to ensure the product quality. It is a difficult problem to test the com- plicated VLSI such as MCU. This paper we analyzes some methods of generating test pattern. On the basis of this, it de- tailed introduce a new method to generate MCU test pattern. Test pattern is divided into two parts, which include testing in- put and testing response. Testing input can be accomplished by special script software which can switch compile routine to special test pattern for ATE, while test pattern about testing response can be accomplished by matching about ATE. Finally MCU can be test successfully.

关 键 词：测试系统 测试向量 单片机 

分 类 号：TM93[电气工程—电力电子与电力传动]