SOI材料非对称脊型波导结构PDL标准样品研究  

Study on standard sample of polarization dependent loss manufactured by SOI asymmetric-ridge waveguide

作　　者：李健[1] 安俊明[1] 徐楠[1] 张志新[1] 李建威[1] 

机构地区：[1]中国计量科学研究院光学所,北京100013

出　　处：《光学技术》2010年第5期733-735,共3页Optical Technique

摘　　要：通过制备非对称结构SOI脊型波导,设计并优化得到一个偏振相关损耗标准样品,通过与标准单模光纤耦合封装,实现了偏振相关损耗测试仪表的快速校准。该器件偏振相关损耗值为0.58dB,测量重复性相对标准差为0.02,测量不确定度为0.2dB。Through the preparation of non-symmetrical structure SOI ridge waveguide,a polarization dependent loss（PDL）standard sample is designed and optimized.Through coupling packaged with standard single-mode fiber,the sample can be used in rapid calibration of PDL test instruments.The PDL of the standard sample is 0.58dB,the measurement relative standard deviation is 0.02,the uncertainty of measurement system is 0.2dB.

关 键 词：脊型波导 偏振相关损耗 SOI材料 

分 类 号：TN252[电子电信—物理电子学]