板级电路内建自测试建模技术研究  

Study of Modeling of Built-in-self-test Technology for board-level circuit

作　　者：王石记[1] 朱敏[2] 杨春玲[2] 

机构地区：[1]北京航天测控技术开发公司,北京100025 [2]哈尔滨工业大学电气工程学院,哈尔滨150001

出　　处：《微计算机信息》2010年第26期176-178,共3页Control & Automation

摘　　要：板级电路的内建自测试技术使电路具有自测试能力,减少测试周期和测试费用,但是这种电路结构设计与故障诊断难度较大,本文提出了基于多信号模型的板级电路可测性建模方法,并将其应用于板级电路高速数据采集器中。结果证明,大大提高了数据采集器的故障检测率和故障隔离率,通过电路本身的控制器还可以实现电路的自测试,本论文的研究成果对各种电子电路的可测性设计具有实际的指导意义。Built-in-self-test technologies for board-level circuits enable circuits to test themselves and reduce the testing cycles and testing costs. However, it is difficult to design circuit structures and diagnose circuit faults in this kind of circuits. Modeling techniques represented by multi-signal model modeling techniques can be effective methods to analyze the testability of board-level selftest system. This paper introduces the conception of multi-signal model and modeling process in detail, and proposed testability design rules based on multi-signal model, which is based on the analysis of testability. Finally, by taking a data acquisition circuit as an example, the article completed its analysis and design of testability . The results show that multi-signal model can not only analyze the testability of board-level circuits, but also have the actual guiding value for the design of practical testability.

关 键 词：多信号模型 可测性设计 可测性分析 板级电路 

分 类 号：TN702[电子电信—电路与系统]