双层结构PID控制器性能评估研究  

Performance assessment of PID controller based on two-layer structure

作　　者：周猛飞[1,2] 蔡亦军[1] 谢磊[2] 王树青[2] 

机构地区：[1]浙江工业大学化学工程与材料学院,浙江杭州310014 [2]浙江大学工业控制技术国家重点实验室,智能系统与控制研究所,浙江杭州310027

出　　处：《计算机与应用化学》2010年第10期1383-1386,共4页Computers and Applied Chemistry

基　　金：国家自然科学基金资助项目(60904039);国家高技术研究发展计划(863)(2007AA04Z162);国家高技术研究发展计划(863)(2008AA042902).

摘　　要：针对工业过程常规PID控制回路普遍存在性能退化的现状,提出了1种基于双层结构的PID控制器性能评估方法,该方法可综合地评估PID控制器的性能。其中第1层次的评估只需最少量的过程信息,即采用最小方差基准和脉冲响应曲线方法对PID控制器的随机性性能和确定性性能两方面给出初步的评估。第2层次是基于PID结构的控制器性能评估,这个层次的评估更符合生产实际,但需要用到更多的过程知识和信息。最后将所提出的方法分别应用于仿真过程和工业实际过程。For the gradual degradation of PID controller performance in the industry,a two-layer structure method is developed to estimate the performance of PID controller,and the method provides an integrated performance analysis of PID controller.Minimum variance control benchmark and impulse response curve plot are employed in the first layer,which only require the minimum process information compared to other methods of performance assessment.Minimum variance control benchmark is used to access a controller stochastic performance.Impulse response curve plot is used to describe a controller deterministic performance.A controller performance benchmark based on the restricted structure of PID controllers is used in the second layer,which is more realistic performance measures but generally requires more process information than the MVC-based approaches.The developed performance assessment technique is illustrated by simulation and industrial examples.

关 键 词：PID控制器 性能评估 双层结构 随机性性能 确定性性能 

分 类 号：TP277[自动化与计算机技术—检测技术与自动化装置] TQ021.8[自动化与计算机技术—控制科学与工程]