短路反射法测量复介电常数的研究  

Research For Measurement of Complex Permittivity Using Short-Reflection Method

作　　者：阮开智[1] 韦高[1] 袁晴晴[1] 

机构地区：[1]西北工业大学电子信息学院,陕西西安710129

出　　处：《测控技术》2010年第11期97-99,共3页Measurement & Control Technology

基　　金：陕西省自然科学基础研究计划(2006F15);西北工业大学科技创新基金(2006CR11)

摘　　要：研究了基于波导六端口反射计系统的短路反射法测量介质材料复介电常数的测量原理,通过六端口反射计测量得到介质样品加载前后参考面的复反射系数,求得样品介质的相对介电常数和损耗正切。提出了一种新的求解复超越方程的数值解法,该方法以泰勒近似获取初值,通过梯度迭代得到最终结果,避免了复超越方程中无用多值的出现。实际测试结果表明,该方法可以快速单一地测得介质材料的相对介电常数,且精度较高。Theory for measurement of complex permittivity using short-reflection method based on wave-guide six-port reflectometer system is researched on.The complex reflection coefficients at measurement reference plane,which measured by six-port reflectometer,are used for calculating the relative permittivity and loss tangent of material.A new numerical solution for solving the complex transcendental equation is presented.The new method obtains initial value by taylor method,then gains the ultimately results by the grads method.It avoids the appearance of many useless solutions of complex transcendental equation.The test results show that it can measure the relative permittivity of material quickly,uniquely and accurately.

关 键 词：短路反射法 复介电常数 六端口反射计 数值解法 

分 类 号：TM930.12[电气工程—电力电子与电力传动]