晶体管爆裂噪声的积分双谱检测方法研究  

The Study of the Method about Detection on Burst Noise in Transistor Using the Integrated Bispectrum

作　　者：丛玉良[1] 王树勋[1] 赵继印[1] 戴逸松[1] 

机构地区：[1]吉林工业大学电子工程系

出　　处：《电子学报》1999年第5期99-100,共2页Acta Electronica Sinica

摘　　要：本文根据对积分双谱分布特性分析，论证了晶体管爆裂噪声是服从非高斯且非对称分布的，并提出可利用积分双谱方法来检测晶体管爆裂噪声．Based on the characteristic of the integrated bispectrum,it can be proved that the probability density function of burst noise is non Gaussian and asymmetric.The method of detection on burst noise in transistor using the integrated bispectrum is given in this paper.

关 键 词：晶体管 爆裂噪声 积分双谱 检测 

分 类 号：TN320.7[电子电信—物理电子学]