SoC事务级随机测试功能验证有效性评估  

Evaluating Effectiveness for Random Testing of SoC Transaction Level Functional Verification

作　　者：马秦生[1] 高洵[1] 曹阳[1] 苏璠 

机构地区：[1]武汉大学电子信息学院,武汉430072

出　　处：《中国集成电路》2011年第1期66-70,共5页China lntegrated Circuit

摘　　要：针对测试向量放回和不放回两种情况,采用对比评估法,以发现错误的能力和提交的可靠性为标准,论证了SoC事务级随机测试功能验证的有效性。评估结果表明,划分测试仅在错误区包含某个或几个子域的特殊情况下有高于随机测试的验证效果,而随机测试则可能在更一般的情况下优于划分测试的验证效果。Taking the ability of the？discovering mistakes and the reliability of the submission for the replacement and without replacement of the testcase, the testing validity of the functional verification based on the random testing for the transaction level of the System-on-Chip was evaluated theoretically by the comparison approach. The evaluation result indicated that the efficiency of the partition testing was better than that of the random testing only when one or more subdomains were covered over with the area of errors, although the efficiency of the random testing was generally better than that of the partition testing.

关 键 词：超大规模集成电路 验证 随机过程 功能 事务级 

分 类 号：TN47[电子电信—微电子学与固体电子学]