光学元件群延迟的直接测量  

Direct measurement of group delay of optical elements

作　　者：邓玉强[1] 孙青[1] 于靖[1] 

机构地区：[1]中国计量科学研究院光学所,北京100013

出　　处：《物理学报》2011年第2期712-716,共5页Acta Physica Sinica

基　　金：国家科技支撑计划(批准号:2006BAF06B05);中国计量科学研究院基本科研业务费(批准号:AKY0904;AKY0748)资助的课题~~

摘　　要：提出了一种测量群延迟的新方法,利用白光干涉仪产生的光谱干涉,通过时间频率联合分析直接得出群延迟,减小了传统相位差分方法产生的误差,并通过测量结果减去系统背景,进一步提高了光学元件色散测量的准确度.该方法适合于具有复杂色散光学元件群延迟和色散的准确测量,也适合于慢光器件群速度延迟的测量.A technique for direct measurement of group delay of optical elements is introduced. With the joint time-frequency analysis of white-light spectral interferogram,group delay can be directly extracted from the ridge of wavelet-transform. The technique is accurate and simple. The measurement results of group delay and group delay dispersion of a piece of fused silica was demonstrated. The results agree well with those from theoretical calculation,and the noise is greatly reduced. This technique is suitable for various application of white-light interferometer.

关 键 词：色散测量 白光干涉 时间频率分析 超快激光 

分 类 号：TH74[机械工程—光学工程]