外推长度对铁电存储材料BaTiO_3薄膜极化分布的影响  

Effect of the Extrapolation Length on the Polarization Properties of Epitaxial Ferroelectric BaTiO_3 Thin Films

作　　者：胡增顺[1] 

机构地区：[1]开封大学公共计算机教研部,河南开封475004

出　　处：《开封大学学报》2010年第4期87-89,96,共4页Journal of Kaifeng University

基　　金：2010年河南省教育厅自然科学基础研究计划项目

摘　　要：基于朗道-德文希尔(Landau-Devonshire)平均场热力学理论,计算并阐述了在非对称的边界条件下外延生长的铁电存储材料BaTiO3薄膜的极化特性,特别研究了外推长度在薄膜由顺电相到铁电相的相变中所表现出来的重要作用,得出铁电薄膜的极化特性及其分布强烈地依赖于外推长度的取值,揭示了外推长度在铁电薄膜的铁电相变中的物理本质.Effects of the extrapolation length on the phase transformation of epitaxial ferroelectric BaTiO3 thin films on dissimilar cubic substrates have been studied on the basis of the mean-field Landau-Devonshire thermodynamic theory by taking an uneven distribution of the interior stress with thickness into account.It has been found that the polarization of epitaxial ferroelectric thin films are strongly dependent on the extrapolation length of films.The physical origin of the extrapolation length during the phase transformation from paraelectric to ferroelectric was revealed in the case of ferroelectric thin films.

关 键 词：铁电薄膜 铁电性能 朗道-德文希尔(Landau-Devonshire)理论 

分 类 号：TN384[电子电信—物理电子学]