导电聚合物薄膜电阻率测量系统的设计  

Design of Electronic Resistivity Measuring System for Conductive Polymer Film

作　　者：付庆波[1] 王锐[1] 曹包华[1] 王金明[1] 王红波[1] 赵纯[1] 

机构地区：[1]吉林大学电子科学与工程学院集成光电子学国家重点联合实验室吉林大学实验区,吉林长春130012

出　　处：《现代电子技术》2011年第6期144-147,共4页Modern Electronics Technique

基　　金：国家自然科学基金资助项目(20773044)

摘　　要：介绍一种实用的导电聚合物薄膜电阻率测量系统。电阻率的测量原理基于四探针法与比率测量法,以低值恒压激励代替恒流激励,使2种方法结合在一起;然后以ARM7微控制器为系统核心,构建了量程自适应的半自动式系统架构;对电路实际能达到的分辨率和设计要求分辨率进行详细的分析;最后测量了系列标准电阻和部分导电聚合物薄膜样品的电阻率值,与标准方法进行了对比,分析了系统各项指标。A design of electronic resistivity measuring system for conductive polymer film is introduced. The basic principle of resistivity measuring is on the basis of four probes and ratio metric measuring methods. The two methods are combined together by using a voltage excitation instead of current excitation. Then the semi-automatic system is constructed based on an ARM7 microcontroller. The difference between the resolution of the designed system and the resolution that the design should have is analyzed. In the end, a series of standard resisters and some samples of conductive polymer film are compared. The test results are analyzed by comparing the standard methods.

关 键 词：电阻率 四探针 比率测量法 导电聚合物薄膜 

分 类 号：TN710-34[电子电信—电路与系统] TQ317.3[化学工程—高聚物工业]