GIS耐压试验中电晕损耗对品质因数的影响  

Influence of Corona Loss on Quality Factor in GIS Voltage Tests

作　　者：赵峻峰[1] 吴灏[1] 王炜[1] 张晓宽[2] 

机构地区：[1]石家庄供电公司,石家庄050091 [2]河北省电力研究院,石家庄050021

出　　处：《河北电力技术》2011年第1期46-48,共3页Hebei Electric Power

摘　　要：分析不同试验回路中品质因数及高压导线电晕损耗的影响因素,通过耐压试验实例阐述电晕损耗与品质因数的关系,提出减小高压导线电晕损耗以增大品质因数的建议。This paper analyzes the influence factors on quality factor and high voltage line corona loss during vary test circuit loop, expounds the relationship between the corona loss and quality factor through withstand voltage test example, put forwards the suggestion that reducing corona loss of high voltage line can raise quality factor.

关 键 词：GIS 耐压试验 电晕损耗 品质因数 

分 类 号：TM851[电气工程—高电压与绝缘技术]