低含量多元素物质的快速全反射X荧光分析  

HighSpeed Analysis of Solution Containing Trace Elements by TXRF

作　　者：田宇宏[1] 刘恺[1] 邬旭然[1] 郑素华[1] 王景云 马国立 

机构地区：[1]烟台大学物理系

出　　处：《光谱实验室》1999年第3期243-246,共4页Chinese Journal of Spectroscopy Laboratory

摘　　要：本文介绍了用全反射Ｘ荧光分析仪对样品量很少、元素含量很低、多元素溶液的分析，测定了从含量最多的Ｎａ（２４３μｇ／ｍＬ）到含量最少的Ｃｕ（０．０６μｇ／ｍＬ）的１２种元素。The highspeed analysis of solution containing trace elements with total reflection Xray fluorescence (TXRF) analyzer developed by yantai university was presented. Twelve elements from maximum 243g/mL (Na) to minimum 0.06g/mL (Cu) were determinated. Some of them were compared with known values. During determination of tap water, multiple measurements with same sample addition and responsible date processes were done so as to reduce remarkably effects of accidental error and error caused by blank value.

关 键 词：全反射 元素分析 X射线荧光分析 TXRF 

分 类 号：O657.34[理学—分析化学]