便携式X荧光光谱仪在莫高窟壁画原位无损检测的初步应用  

A study on non-destructive analysis of Dunhuang murals in-situ by using PXRF

作　　者：崔强[1] 张文元[2,3,1] 苏伯民[2,3,1] 范宇权[2,3,1] 李燕飞[2,3,1] 

机构地区：[1]敦煌研究院保护研究所,甘肃敦煌736200 [2]国家古代壁画保护工程技术研究中心,甘肃敦煌736200 [3]古代壁画保护国家文物局重点科研基地,甘肃敦煌736200

出　　处：《敦煌研究》2010年第6期77-81,共5页Dunhuang Research

基　　金：文物移动实验室在考古发掘现场应用支撑技术研究(2010BAK67BOG)

摘　　要：利用便携式X荧光分析仪在莫高窟洞窟现场对壁画颜料进行了检测。对比以前的检测结果,我们发现便携式X荧光分析仪在石窟寺壁画这种不可移动文物的调查中凸显出了极佳的便携性,并且具有分析速度快、结果较为准确的特点。PXRF is a good elements detecting technology by which we can obtain the species and content of the elements in cultural relics and infer many valuable informations.In this article the wall-painting pigments in the Mogao Grottoe were detected by PXRF.Compared with the former detecting methods,it is proved that the PXRF is a non-destructive testing technology with excellent portability nature,real-time analysis and accurate results for the study of immovable relics such as Grotto Paintings.

关 键 词：莫高窟 便携式X荧光光谱 原位 无损分析 壁画 颜料 

分 类 号：K879.41[历史地理—考古学及博物馆学]