基因芯片技术对过铁胁迫条件下酵母硫转运的分析  

Analysis on Yeast Sulfur Transfer under Iron Excess Stress by Gene Chip Technique

作　　者：王俐勇[1] 印莉萍[1] 

机构地区：[1]首都师范大学,北京100048

出　　处：《安徽农业科学》2011年第7期3842-3845,共4页Journal of Anhui Agricultural Sciences

基　　金：北京市教委科技发展基金重点项目(KZ200710028013)

摘　　要：利用基因芯片技术在转录水平上对过铁胁迫条件下酵母中硫转运体系进行了分析。结果表明,在铁过量的时候,酵母硫转运系统相关基因上调表达。认为酵母在过铁条件下会增加细胞中的硫转运,以便维持细胞的铁稳态,降低过量铁对细胞的毒害作用。The gene chip technique was adopted to analyze the yeast sulfur transfer under iron excess stress at yeast transcriptional level.As indicated by the results,under the iron excess,the expression of related genes to the sulfur transfer in yeast was up-regulated.It was deemed that the sulfur transfer in the yeast cells increased under the iron excess so as to maintain the iron stability in its cells and reduce the toxicity to its cells brought by iron excess.

关 键 词：芯片 酵母 过铁胁迫 硫转运 

分 类 号：S183[农业科学—农业基础科学]