基于纹理特征的太阳能晶片计数研究  

Solar energy wafer counting based on textural property

作　　者：方超[1] 谭伟[1] 杜建洪[1] 

机构地区：[1]复旦大学信息科学与工程学院,上海200433

出　　处：《信息与电子工程》2011年第2期185-189,共5页information and electronic engineering

摘　　要：针对工业生产中太阳能晶片人工计数的难以实施,本文提出了运用数字图像处理技术的自动计数方法。从具体应用角度出发,通过对晶片叠层图像的纹理分析,先用一阶统计量法和边缘检测投影法对晶片区域进行定位,然后通过极值点分析法进行计数。实验结果表明该算法的定位准确度可达到94%以上,计数正确率可以达到95%,而且算法简单可行,具有实用价值。This article presents an automatic counting method using digital image processing to solve difficulties in manual Solar Energy Wafer（SEW） counting in industry production.By analyzing the image texture of overlaid wafers,the author firstly locates wafer area employing first-order statistics method and edge detection projection,and then performs counting by extremum analysis in this practical application.The experiment results show that the algorithm is highly accurate with the locating accuracy up to 94% and the counting accuracy up to 95%,and it is convenient and applicable.

关 键 词：纹理特征 垂直投影 边缘检测 极值点分析 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]