迈克尔逊干涉仪测量平行透明物厚度或折射率  

Refractive Index or Thickness of the Parallel Transparency Measured by Michelson Interferometer

作　　者：万伟[1] 周竣峰[1] 邵剑波[1] 王余刚[1] 

机构地区：[1]西南科技大学理学院,四川绵阳621002

出　　处：《实验科学与技术》2011年第2期37-39,共3页Experiment Science and Technology

摘　　要：迈克尔逊干涉仪可较方便的获得稳定的等倾干涉现象。光路中介质特性的变化直接影响等倾干涉条纹的分布状况。用等倾干涉测量介质厚度或折射率,一般须避免对难于测量的入射光倾角和干涉条纹绝对级次等量的确定,传统的方法往往采取移动反射镜或改变被测介质的几何位置以获得等倾条纹中心级次改变来实现。如果合理利用透镜的成像原理和入射光小角度下良好的近似关系,则可简便地通过测定等倾干涉条纹直径,来确定平行透明物的厚度或折射率。It can be convenient to use the Michelson interferometer to get the steady phenomena of equal inclination.The change of medium＇s characteristic in path of rays effects the distribution of the rings of equal inclination immediately.The variables of the ranks in the center of interference of equal inclination are gained universality by moving the illuminating mirror or changing the position of the medium.One can measure the refractive index or thickness of the medium with the phenomena of interference of equal inclination,instead of measuring the angles of incident lights and the absolute ranks of rings.By means of the theory about imaging of lens and the nicer approximate relation in small angles,it can achieve easily that ascertaining the refractive index or thickness of the parallel transparency by measuring the diameter of rings of equal inclination.

关 键 词：迈克尔逊干涉仪 等倾干涉 条纹直径 

分 类 号：O436.1[机械工程—光学工程] G642.0[理学—光学]