基于微程序设计的内建自测试技术研究  

Study on built-in self test technology based on the microprogramming

作　　者：郑文荣[1,2] 刘少伟[1] 王树宗[2] 

机构地区：[1]92941部队94分队 [2]海军工程大学兵器工程系

出　　处：《国外电子测量技术》2011年第5期20-22,44,共4页Foreign Electronic Measurement Technology

摘　　要：介绍了一种基于微程序构建的控制系统内建自测试体系,设计中运用了3种不同类型的微指令,将性线移位寄存器作为响应分析器,用于电路响应信号压缩;对自测试体系在测试诊断过程中各微程序执行的工作流程和诊断原理进行详细分析。基于微程序设计的控制系统诊断体系具有较高的故障诊断和检测效果,可精确定位系统中板级电路故障。A design of built-in self test（BIST） in one control system based on the microprogramming is introduced.There are three kinds of micro instructions in the BIST system,and the linear feedback shift register（LFSR） is used as response signature analyzer is the BIST to compress the circuit＇s signature.The flow graph of the running of microprogramming and principle of the BIST architecture in diagnose process is proposed.The design of BIST based on microprogramming has excellent capabilities to diagnosis and detect the fault,which can locate the fault of circuit on board accurately.

关 键 词：微程序 微指令 内建自测试 线性反馈移位寄存器 混淆概率 

分 类 号：TN407[电子电信—微电子学与固体电子学]