微波器件噪声参数的测量方法  

Measurement Method on Noise Parameters of Microwave Devices

作　　者：梁法国[1] 吴爱华[1] 郑延秋[1] 

机构地区：[1]中国电子科技集团公司第十三研究所,石家庄050051

出　　处：《半导体技术》2011年第6期478-482,共5页Semiconductor Technology

摘　　要：作为微波低噪声器件研制和应用的一项关键技术,噪声参数的测量工作引起行业的广泛关注。论述了噪声参数测量原理,研究了测量系统校准方法,分析了噪声源的反射系数、噪声温度,阻抗调配器的反射系数、S参数、增益,接收机的反射系数、噪声功率等20余项物理量对噪声参数测量的影响,对比了直接冷源法和简化冷源法在接收机传输增益测量中的优缺点,提出了改进型冷源法。最后给出了噪声参数测量不确定度主要影响量的归类分析,为下一步开展噪声参数不确定度评定工作奠定了基础。The measurement of noise parameters,as a key technology of the development and application of the microwave low-noise devices,is drawing more and more attention.The principle of thenoise parameter measurement was discussed,the calibration method of the measurement system wasstudied,and more than twenty physics quantities were analyzed,which influence the noise parameter measurement,including the reflection coefficient and noise temperature of the noise source,the reflection coefficient,gain and S-parameters of the impedance tuner,the reflection coefficient and noise power ofthe receiver,and so on.Compared with the merit and demerit between the direct cold-source method andsimplified cold-source method in the receiver transducer gain,the improved cold-source method was proposed.Finally,the class analysis for the main influence factors of noise parameter measurement uncertainty was provided.The way for the following noise parameter uncertainty evaluation is paved.

关 键 词：噪声参数测量 冷源法 噪声功率 最小二乘法 S参数 

分 类 号：TN407[电子电信—微电子学与固体电子学]