基于93000 ATE的高速高分辨率ADC动态参数测试  

Measurement of Dynamic Parameters of High-Speed and High-Resolution A/D Converter Based on 93000 ATE

作　　者：肖鹏程[1] 牛林业[1] 高亮[1] 陆振海[1] 

机构地区：[1]复旦大学专用集成电路与系统国家重点实验室,上海201203

出　　处：《微电子学》2011年第3期474-478,共5页Microelectronics

摘　　要：基于Verigy 93000 ATE,采用外挂高性能晶振和射频信号源的测试方案,实现了11位分辨率AD80141最高400 MHz输入信号的测试。结果表明,输入信号为140 MHz以下时,SNR测试值与目标值相差不到1 dB;输入信号为300 MHz、400 MHz时,SNR测试值分别达到59.46dB和57.03 dB。Based on Verigy 93000 ATE,an 11-bit A/D converter,AD80141,with an input signal up to 400 MHz was measured using external high performance crystal oscillator and RF generator.Test results showed that,for input signal frequency below 140 MHz,the measured SNR value was only less than 1 dB from target value,and for input frequencies up to 300 MHz and 400 MHz,the measured SNR were 59.46 dB and 57.03 dB,respectively.

关 键 词：自动测试设备 A/D转换器 动态参数测试 

分 类 号：TN30[电子电信—物理电子学]