检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
机构地区:[1]新余学院新能源科学与工程学院,江西新余338000
出 处:《电源技术》2011年第10期1246-1248,共3页Chinese Journal of Power Sources
基 金:2010年江西省教育厅科技项目(GJJ10647);2009年江西省高校省级教改项目(JXJG-09-24-2);2009年校级招标课题资助项目
摘 要:采用各向同性腐蚀法制备多晶硅绒面,利用正交实验法研究了不同腐蚀液配方中的HNO3、HF和缓和剂NaH2PO4·2H2O的含量对多晶硅太阳电池绒面的反射率和腐蚀速度的影响。结果表明:NaH2PO4.2 H2O溶液对腐蚀速度有着显著的影响,其次为HF溶液和HNO3溶液;对于反射率来说,其影响因素的重要性主次顺序为HF溶液、HNO3溶液、NaH2PO4·2 H2O缓和剂。在本实验条件下,最佳的酸腐蚀混合液配方为HF∶HNO3∶NaH2PO4.2 H2O=9∶1∶7,在该工艺条件下,制备的硅片绒面腐蚀坑较为均匀,反射率为17%左右。Texturing of multicrystaltine silicon was prepared by isotropic acidic etching in this paper. The reflectance and etching rate of texturing of multicrystalline silicon solar cell with orthogonal experiment were studied to investigate the effects of content of HNO3, HF and NaH2PO4.2 H2O under different formula of etching solution. The results reveal that NaH2PO4.2 H2O solution has a remarkable effect on the etching rate, then HF solution is the most important factors for reflectance, the second are HF and HNO3 solutions. The primary-secondary order of affect factors are HF, HNO3 and NaH2PO4O2 H2O solution for reflectance. In this experiment, the optimal proportion of acidic etching mixture solution was HF : HNO3 : NaH2PO4.2 H2O = 9 : 1 : 7. Under the process condition, texturing of multicrystalline silicon was fabricated with more uniform etch pit with reflectance of around 17%.
分 类 号:TM615[电气工程—电力系统及自动化]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:3.145.15.7