光电探测器组件辐照后性能退化的噪声表征  

Noise Characterization on Degradation of Photodetector Module under TID

作　　者：张兴[1] 王品红[2] 但伟[2] 曹飞[2] 陈春霞[2] 邹泽亚[2] 李祖安[2] 

机构地区：[1]重庆邮电大学光电工程学院,重庆400065 [2]重庆光电技术研究所,重庆400060

出　　处：《半导体光电》2011年第5期634-635,727,共3页Semiconductor Optoelectronics

摘　　要：本文用爆裂噪声表征总剂量电离辐射(TID)对光电探测器组件的损伤情况。通过对辐照前后的光电探测器组件进行噪声测试,然后对比分析其结果。实验结果表明,总剂量辐照后,相对于辐照前,光电探测器组件内部明显出现了爆裂噪声,即组件内部出现了大量缺陷,导致组件的可靠性降低。The burst noise was used to characterize the degradation behavior of photodetector module radiated by the Total Ionizing Dose（TID） in this paper.The noise of photodetector module was tested before and after radiation,then the time domain waveform and the spectrum curve were analyzed.Experimental curves indicate that the burst noise caused by defection is observed apparently,which means the reliability of photodetector module is greatly decreased.

关 键 词：总剂量电离辐射 爆裂噪声 损伤情况 可靠性 

分 类 号：TN364.2[电子电信—物理电子学]