低能离子注入种子的深度浓度分布的模拟  

SIMULATION OF THE DEPTH-CONCENTRATION DISTRIBUTION FOR LOW ENERGY IONS IMPLANTED INTO SEED

作　　者：王林香[1] 祝恒江[1] 郭常新[2] 王世亨[3] 

机构地区：[1]新疆师范大学物理系,新疆乌鲁木齐830054 [2]中国科学技术大学物理系,安徽合肥230026 [3]新疆大学物理系,新疆乌鲁木齐830046

出　　处：《核农学报》2011年第5期886-891,共6页Journal of Nuclear Agricultural Sciences

基　　金：新疆师范大学高校科研计划优秀青年教师科研启动基金(xjnu200607)

摘　　要：使用蒙特卡洛方法,在一维和二维模型下分别计算了20keV的Ti+分别注入彩棉种子和花生种子的深度浓度分布。通过与同样初始条件下的TRIM程序计算结果和高斯拟合结果比较,本研究提出的二维模型获得的计算结果更加接近实验值。使用该二维模型计算了不同剂量下110keV的Fe+注入彩棉种子和花生种子的深度浓度分布,并分析讨论了计算与实验结果有差异的一些原因。同时,使用二维模型计算和预测了20keV的Fe+和N+分别注入彩棉和花生种子的深度浓度分布。结果表明理论模型建立相对合理,为研究离子与种子靶材料的相互作用提供了一种理论计算方法。The depth-concentration distributions for 20keV titanium ions implanted into color cotton seed and peanut seed were calculated in one and two dimensional models using the Monte Carlo method.Compared with the computational results of TRIM procedure and Gaussian fitting,the computational results of the two dimensional model proposed by this study were well matched with experiment results.The depth-concentration distributions for 110keV iron ion under the different doses implanted into the color cotton seed and the peanut seed were caculated using the two dimensional models.The computational results were analyzed and discussed.The depth-concentration distributions were predicted respectively for iron and nitrogen ions with 20keV energy implanted into color cotton seed and peanut seed using this model,and the results showed that the two dimensional computational model in this study was relatively reasonable and provided a theoretical calculation method for the interaction mechanism of the implantation ions and seed material.

关 键 词：离子注入 TRIM程序 高斯拟合 随机抽样 深度浓度分布 

分 类 号：S335[农业科学—作物遗传育种]