利用自适应遗传算法的芯片功能验证自动测试  

Automatic Test for Chip Function Verification Using Adaptive Genetic Algorithm

作　　者：苏琳琳[1] 张晓林[1] 

机构地区：[1]北京航空航天大学电子信息工程学院,北京100191

出　　处：《应用科学学报》2011年第6期631-636,共6页Journal of Applied Sciences

基　　金：国防科工委民口专项基金资助

摘　　要：针对芯片功能验证中存在的验证时间长以及与被测系统依存度高的问题,提出了利用自适应遗传算法的芯片功能验证自动测试方法.定义了事件的功能覆盖率和翻转覆盖率,分析了两种覆盖率之间的关系,采用两种覆盖率共同构造适应函数,提高了验证的可靠性.与采用经典遗传算法的验证方法相比较,能达到相同的覆盖率,同时可减少25%～30%的测试时间,提高不仿真效率.This paper addresses two problems occurring in chip function verification：long verification time and high interdependency between verification and design under test.An automated test method using an adaptive genetic algorithm is presented for chip function verification.Event function coverage and event toggle coverage are defined,and the relationship between the two kinds of coverage is given.A fitness function is generated to improve reliability using the function coverage and toggle coverage.Achieving the same coverage, the test time is reduced by about 25%~30%with the proposed method as compared to the simple genetic algorithm.

关 键 词：功能验证 自适应遗传算法 功能覆盖率 翻转覆盖率 自动测试 

分 类 号：TN47[电子电信—微电子学与固体电子学]