基于配准的红外焦平面阵列条纹非均匀性校正  

Stripe nonuniformity correction based on registration for infrared-focal plane arrays

作　　者：任建乐[1] 陈钱[1] 钱惟贤[1] 

机构地区：[1]南京理工大学近程高速目标探测技术国防重点学科实验室,江苏南京210094

出　　处：《红外与毫米波学报》2011年第6期499-502,506,共5页Journal of Infrared and Millimeter Waves

基　　金：国家自然科学基金(61101199);江苏省自然科学基金(BK2011699);江苏省博士后科研资助计划项目(1101081C)

摘　　要：条纹非均匀性是线扫红外焦平面阵列和非制冷凝视型红外焦平面阵列成像系统中一种特殊的固定图案噪声.分析了其产生的原因,提出了一种基于亮度恒定假设和配准的条纹非均匀性校正算法.根据相邻两帧获得亮度均方误差函数,最后通过最小化全局亮度均方误差函数得到全局最优解作为非均匀性校正的参数.实验结果表明,该算法能够在几帧内达到较好的收敛,且计算简单,有效提高了条纹非均匀性的校正效果.Stripe nonuniformity is a very typical fixed pattern noise in line infrared focal plane arrays（IR-FPA） and uncooled staring IR-FPA.Its origination was analyzed.A stripe nonuniformity correction algorithm based on brightness constancy assumption and registration was proposed.Brightness mean-square error function was obtained according to adjacent frames.Nonuniformity correction parameters could be derived through the unique global optimum by minimizing the function.Experimental results indicate that the proposed algorithm could achieve a great convergence in several frames with low computational complexity and enhance the effective of stripe nonuniformity correction.

关 键 词：红外焦平面阵列 条纹非均匀性校正 亮度恒定 配准 

分 类 号：TN911.73[电子电信—通信与信息系统]