晶体管中子损伤常数的测量以及不确定度分析  

Measurement of the Damage Constant for Bipolar Transistors and Estimation of Its Uncertainties

作　　者：白小燕[1] 林东生[1] 杨善潮[1] 李达[1] 刘岩[1] 金晓明[1] 王桂珍[1] 

机构地区：[1]西北核技术研究所,西安710024

出　　处：《半导体技术》2012年第1期83-86,共4页Semiconductor Technology

摘　　要：在西安脉冲反应堆上,利用自建的晶体管放大倍数在线测试系统测量了型号为2N2222A的晶体管放大倍数,获得了放大倍数随中子注量的变化曲线。晶体管放大倍数的倒数和中子注量之间有良好的线性关系,利用最小二乘法对该线性关系进行拟合,得到晶体管的中子损伤常数。重点在于对损伤常数不确定度的评定。详细给出了不确定度评定的过程,分析了过程中的各种不确定度来源并对它们逐一进行了计算。不确定度评定的难点在于利用最小二乘法拟合损伤常数过程中如何同时考虑自变量和因变量的不确定度。这个问题在实际问题中很少被碰到。并引入迭代的思想,在现有的数据处理工具基础上简单有效地解决了该问题,避免了复杂运算。The common emitter current gain for 2N2222A silicon bipolar transistors under Xi＇an pulsed reactor （XAPR） was measured and the relationship between the gain and the neutron fluence was got. Reciprocal of the gain was linear in neutron fluence. The damage constant was computed from the relationship by the least squares method. The estimation of uncertainties of the damage constant was the key point. The processes for uncertainties were analyzed, and the different sources were computed respectively. The major difficulty was how to consider errors of the dependent and independent variables simultaneously in the least squares method. This problem was relatively infrequent. To resolve this problem, an iterative method was introduced into the least squares method. Then the problem was solved briefly and effectively on the basis of the existing software.

关 键 词：不确定度 损伤常数 迭代法 西安脉冲反应堆 自变量 因变量 

分 类 号：TN32[电子电信—物理电子学] TL81[核科学技术—核技术及应用]