基于CCD和光栅尺的布氏硬度测量装置  

The Brinell Hardness Measurement Device Based on CCD and Grating Ruler

作　　者：陶继增[1] 石伟[1] 李金颖[1] 

机构地区：[1]中航工业北京长城计量测试技术研究所,北京100095

出　　处：《计测技术》2011年第6期18-20,共3页Metrology & Measurement Technology

基　　金："十一五"技术基础计量科研项目资助

摘　　要：将CCD和光栅尺同时应用于布氏硬度压痕测量,试验证明:系统测量结果基本不受CCD对焦及照明光强变化的影响;测量准确度容易保证,重复性好,自动化程度及效率较高,同时大大缓解了布氏硬度测量中的视觉疲劳。The CCD and grating ruler were applied to Brinell Hardness measurement in this paper.It was proved that the change of focus and illumination intensity of CCD have little influence on the hardness result.The measurement precision and repeatability were easily realized.As the hardness was measured more automatically and efficiently,the visual fatigue was alleviated.

关 键 词：CCD 光栅尺 布氏硬度 

分 类 号：TB938.2[一般工业技术—计量学] TP212.9[机械工程—测试计量技术及仪器]