基于DFT的含FPGA电路板的测试方法研究  

Study on Test Method of FPGA Circuit Board based on DFT

作　　者：蔡士闯[1] 王学伟[1] 

机构地区：[1]海军航空工程学院控制工程系,烟台264001

出　　处：《宇航计测技术》2011年第6期61-64,68,共5页Journal of Astronautic Metrology and Measurement

摘　　要：随着微电子技术的不断发展,复杂逻辑器件大量应用到武器装备电路板上,电路板结构功能日趋复杂。与此同时,芯片集成度的大幅提高使得外部可接触的引脚越来越少,这就导致常规的测试方法无法实现对该类电路板的有效测试,电路板维修、检测问题日益突出。因此,在电子设备设计的开始阶段就采用可测性技术。针对含FPGA电路板,对基于DFT的测试方法进行了研究。With the continuous development of microelectronic technology, more and more complex logic devices are applied to the circuit board of weapons equipment. It makes the growing complexity of the circuit board structure and function, and the traditional method can not be effective for that type of circuit board test. Detection of the circuit board is increasingly prominent. Thus, in the beginning stages of the design of electronic equipment, the technology of the design for testability is introduced. Therefore, for the FPGA circuit board, a test method based on DFT is studied.

关 键 词：逻辑器件 电路板 故障诊断 可测性设计 

分 类 号：TN47[电子电信—微电子学与固体电子学] TN407