脉冲加热红外热成像无损检测的有限元模拟及分析  

Pulse Thermography Analyzed by the Finite Element Method for Nondestructive Testing

作　　者：梅林[1] 陈自强[1] 王裕文[1] 于德弘[1] 

机构地区：[1]西安交通大学,西安710049

出　　处：《西安交通大学学报》2000年第1期66-70,共5页Journal of Xi'an Jiaotong University

摘　　要：为了进行定量化的红外无损检测，必须全面考察脉冲加热冷却的全过程，更准确地得到红外无损检测过程中各参数对缺陷检测的影响．通过三维有限元分析方法模拟了脉冲加热红外无损检测过程，分析了影响脉冲加热红外无损检测灵敏度的几个参数，找出了脉冲加热红外无损检测对比度变化的规律，为进一步进行定量化红外无损评价打下了基础．The process of pulse infrared thermography nondestructive testing is simulated by the finite element method. Taking the heating stage of the process into account, makes the simulation more accurate. The rule for changing contrast is found by analyzing the three dimensional heat conduction behavior. Analyzed are the test sensitivities as influenced by the defect depth, size, heat resistance, pulse heating time and physical properties of the material.

关 键 词：红外热成像 无损检测 有限元分析 仿真 

分 类 号：TG115.28[金属学及工艺—物理冶金] TH878.1[金属学及工艺—金属学]