基于FPGA测试电路的SRAM自测试研究  

SRAM Self-test Research Based on FPGA Test Circuit

作　　者：陈亚坤[1] 

机构地区：[1]电子科技大学,成都610017

出　　处：《单片机与嵌入式系统应用》2012年第1期8-11,共4页Microcontrollers & Embedded Systems

摘　　要：SRAM是微机系统中的记忆设备,用来存放程序和数据。因此对SRAM的自测试可以有效地避免存储器工作不正常给系统带来的损害。采用硬件描述语言对FPGA电路进行编程,构造SRAM测试电路。以对各种存储器常见故障模型能够有效检测的March C-算法为主要测试算法,对存储器单元进行故障测试,并将有错误的地址单元映射到备用的存储单元,以确保微机系统稳定运行。SRAM is a memory device in microcomputer used to store program and data. Therefore, the self-test of SRAM can effectively avoid damage to the system brought by abnormal memory. The paper uses hardware description language to program the FPGA and construct the SRAM testing circuit. March C-algorithm is the main testing method which can detect common faults with a variety of memory models ,and map the wrong address unit to standby unit, making the system work stable.

关 键 词：SRAM自测试 故障模型 FPGA MARCH C-算法 

分 类 号：TP333[自动化与计算机技术—计算机系统结构] TN791[自动化与计算机技术—计算机科学与技术]