有序分子薄膜结构的X射线光电子能谱表征  

Structural Characterization of Organized Molecular Films by X-ray Photoelectron Spectroscopy

作　　者：杨得全[1] 

机构地区：[1]中国空间技术研究院兰州物理研究所应用表面物理实验室,兰州730000

出　　处：《真空科学与技术》2000年第1期31-36,共6页Vacuum Science and Technology

摘　　要：有序分子薄膜由于其特殊的结构而表现出优异的性能。为此 ,人们对微结构与宏观性能之间的关系极为重视。本文重点讨论了近年来X射线光电子能谱在有序分子薄膜位结构分析中取得的结果及其应用情况。其中包括 :薄膜厚度的确定、薄膜 基底界面结构、分子之间的相互作用情况及其有序分子结构对薄膜电学、气体敏感特性等宏观性能的影响。研究结果说明 ,X射线光电子能谱由于其对薄膜的损伤小、表面探测灵敏度高和较高的能量分辨能力 。The main interest in organized molecular films lies in their molecular order which is responsible for most of their specific prop erties as well as their potential applications.In this paper,we report the latest progress in the characterization of organized molecular films, including Langmuir Blo dgett films and self assembly monolayers by X ray photoelectron spectroscopy.Special attention is paid to surface and interface chemical composition,thickness determination,orientational order of molecules,and gas sensoring mechanism.Some aspects of the characterization of Langmuir Blodgett films and Self Assembly Monolayers are also presented.

关 键 词：有序分子薄膜 X光电子能谱 微结构 薄膜结构 

分 类 号：O484.1[理学—固体物理] O484.5[理学—物理]