基于小波子图映射的疵点织物判定方法  

Defect fabric determining based on wavelet subgraph mapping

作　　者：马鑫宇[1] 林意 

机构地区：[1]江南大学物联网工程学院,江苏无锡214122 [2]江南大学数字与媒体学院,江苏无锡214122

出　　处：《计算机工程与应用》2012年第6期166-168,195,共4页Computer Engineering and Applications

基　　金：国家自然科学基金(No.60973094)

摘　　要：为了提高织物自动化疵点检测的效率和准确性,提出了一种基于小波子图映射的疵点织物判定方法,并详细阐述了小波子图映射、子图能量统计、子图能量分析,最终判定这一系列操作过程及相关的理论分析。通过实验以及与相关方法的比较,说明该方法的准确性高,可靠性强,计算量低,实现成本小,具有实践意义。To improve the efficiency and accuracy of automatic fabric defect detection, a method of fabric defects determining based on wavelet subgraph mapping has been proposed, and the process of operation and related theory which the wavelet subgraph mapping, the subgraph energy statistics, analysis of subgraph energy, the final determination is deeply illustrated. Accoding to the experimental resuits and comparison with related metods, the proposed method is with high accuracy, reliability, low computing cost, small implementation cost, and has a practical significance.

关 键 词：疵点检测 图映射 织物 小波 能量分析 操作过程 自动化 相关方 

分 类 号：TP301.6[自动化与计算机技术—计算机系统结构]