绝缘栅双极型晶体管结温测量方法及其发展  

Review of Isolated Gate Bipolar Transistor's Junction Temperature Measurement

作　　者：杨旭[1] 周雒维[1] 杜雄[1] 沈刚[1] 徐铭伟[1] 

机构地区：[1]重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆400030

出　　处：《电测与仪表》2012年第2期7-12,共6页Electrical Measurement & Instrumentation

基　　金：国家自然科学基金资助项目(51077137);科技部国际合作项目(2010DFA72250);输配电装备及系统安全与新技术国家重点实验重点项目资助(2007DA10512711101);中央高校基本科研业务费(CDJZR11150013)

摘　　要：绝缘栅双极晶体管(IGBT)大功率模块已在新能源发电、轨道交通、航空航天、高压直流输电等众多领域得到广泛应用。在包含大容量风力发电的电网中,其可靠性关系到整个电网的稳定。IGBT模块可靠性研究的基础是其失效研究和寿命预测,两者都与结温密切相关。本文首先阐述了IGBT结温测量的重要性,然后根据各种测量方法的特点,将其归为四大类(物理接触法、光学法、温敏参数法和热网络法)进行了阐述,并对比分析了各种方法的优缺点。最后指出结温测量的发展趋势和所需解决的关键问题,以促进该领域的进一步发展。IGBT （Isolated Gate Bipolar Transistor） high-power module has been widely used in new energy generation, railway transportation, aerospace and high-voltage direct current-HVDC transmission.Its reliability is of the greatest importance in the whole system, especially in the power grid including large capacity wind power. Failure analysis and lifetime prediction of IGBT high-power module are the basis of its reliability research, both of them are closely related to the junction temperature. First this paper explains the importance of the junction temperature measurement, classifies all the measurement methods by their characteristics into four categories （physical contact method, optical method, temperature sensitive parameters-TSP method and thermal network method）, and then describes these methods, as well as their advantages and disadvantages. At last, this paper points out the trend of measurement and the key issues to be solved, to promote the further development of the field.

关 键 词：结温 物理接触法 光学法 温敏参数法 热网络法 在线测量 

分 类 号：TM938.8[电气工程—电力电子与电力传动]