两线星型扫描测试控制器设计  

Testing Controller Design Based On Star-2 Scanning

作　　者：建珍珍[1] 颜学龙[1] 

机构地区：[1]桂林电子科技大学电子工程与自动化学院,广西桂林541004

出　　处：《大众科技》2012年第3期63-66,共4页Popular Science & Technology

基　　金：广西研究生科研创新项目(2010105950804M33)

摘　　要：针对现代测试系统需要较少的引脚实现测试要求的现状,IEEE 1149.7标准提供了2线星型(Star-2)扫描拓扑。由于目前Star-2扫描拓扑尚处于理论研究阶段,产生相关的测试信号对今后构建测试系统具有重要的意义。以该标准为依据,利用Quartus II开发平台设计了基于FPGA的两线星型扫描测试控制器,并通过Module-Sim6.4a进行了仿真验证。结果表明该控制器实现了标准协议和高级协议的相互转换,能够产生符合IEEE 1149.7标准的Star-2扫描测试信号以及MScan扫描格式。On account of the situation that modern testing system requires fewer pins to achieve test requirements,the IEEE 1149.7 standard provides a type of scanning topology Star-2.At present Star-2 scanning topology still belongs to the stage of theoretical research,so it is of great significance that producing relevant test signal to construct test system.It designes the Star-2 scanning test controller based on FPGA using the Quartus II platform.The controller is simulated in Module-Sim6.4a environment.Emulation proves that the controller realizes the conversion of the standard protocols and senior protocols,can produce Star-2 scanning test signal and MScan which according to the standard of IEEE1149.7.

关 键 词：IEEE1149.7标准 星型扫描拓扑 高级协议 MSCAN 

分 类 号：TN407[电子电信—微电子学与固体电子学]