基于椭偏光谱仪的石英晶体1310nm处双折射率的精密测量  

Precision Measurement of the Birefringence of Quartz Crystal at 1310nm Based on the Spectroscopic Ellipsometer

作　　者：韩培高 郝殿中 宋连科 苏富芳 史萌 吕廷芬 吴福全 李国华 

机构地区：[1]山东省激光偏光与信息技术重点实验室曲阜师范大学激光研究所,山东曲阜273165

出　　处：《光谱学与光谱分析》2012年第4期1142-1144,共3页Spectroscopy and Spectral Analysis

基　　金：国家自然科学基金项目(60976015);山东省自然科学基金项目(ZR2009GL010);浙江省科技厅分析测试科技计划项目(2011C37046)资助

摘　　要：为了对石英晶体在通讯波段1 310nm处的双折射率进行精密测量,基于椭偏光谱仪对P和S两方向上偏振光相位差的精密测量原理,在透射模式下,通过对琼斯矩阵的分析,设计了一种精密测量晶体双折射率的方法,并在室温(22℃)下对通讯波段1 310nm处石英晶体的双折射率进行了精密测量,测量结果和对误差的分析显示,此方法给出的双折射率测量值的精度高达10-6量级,为目前可查阅的最高精度,对于提高石英晶体相位延迟器件的设计精度具有重要的意义。In order to get the precision measurement of birefringence of quartz crystal at the communication wavelengthl310nm, based on the principle of precision measurement of phase difference between P and S polarized lights of spectroscopic ellipsome ter, a method for precision measurement of birefringence of crystal was designed through the analysis of the Jones matrix under the transmission mode, and the precision measurement of birefringence of quartz crystal at 1 310 nm at room temperature （22 ℃ ） was made, the measuring results and error analysis show that the precision reached 106 level, this is the most precise bire fringence parameter available, and it is of important significance for the improvement of designing precision of phase retardation devices of quartz.

关 键 词：晶体光学 双折射率 椭偏光谱仪 石英 1310nm 

分 类 号：O439[机械工程—光学工程]