红外探测器暗电流测试方法研究  

The Study on the Dark Current of the Infrared Detector Measuring Method

作　　者：雍朝良 段东 许春 陈凡胜 

机构地区：[1]上海技术物理研究所,上海200083

出　　处：《红外技术》2012年第4期196-199,共4页Infrared Technology

摘　　要：在红外集成光电系统中,暗电流及其噪声作为衡量探测器性能的关键指标,在工程上对其进行实际测试具有重要的意义。从工程角度提出了红外探测器暗电流的测试及分析方法。其主要思想是在红外成像系统中,通过改变黑体温度及积分时间,得到不同的拟和曲线,进而通过本文提出的方法计算出探测器的暗电流。In the infrared integrated optical systems,the dark current and its noise are the key indicators of the detector performance,measuring them on a project is of great significance.This article proposed an infrared detector dark current testing and analysis methods from the engineering point of view.The main idea is that,by changing the blackbody temperature and integration time,getting different curve fitting,and then by the proposed method to calculate the detector dark current.

关 键 词：暗电流 辐照度 积分时间 

分 类 号：TM133[电气工程—电工理论与新技术]