一、二次短路铜熔珠微观形态特征比较研究  被引量:12

Comparative study of the micro-morphological characteristics of the first and second short-circuit copper melted beads

在线阅读下载全文

作  者:杨晓红[1] 孟广伊[1] 刘兴芝[1] 马子宁[2] 

机构地区:[1]沈阳工程学院基础部,沈阳110136 [2]中国刑警学院,沈阳110035

出  处:《中国体视学与图像分析》2012年第2期133-137,共5页Chinese Journal of Stereology and Image Analysis

基  金:沈阳工程学院科技基金项目(2011016)

摘  要:通过模拟实验制作电气火灾中一次和二次短路铜熔珠实验样品,利用SEM观察两种熔珠的横截面,对其内部孔洞的微观形态进行定性与定量比较研究。找到可供区别的特征参量:气孔直径D、孔洞数密度N和面积比S/S'。结果表明:在置信概率为95%的条件下,孔洞数密度N>50(个/mm2)时导线发生一次短路。小孔洞(直径D<90μm)面积和与熔珠横截面之比S/S'≈0.8时,发生一次短路的可能性大。出现大气孔(直径D>170μm)时导线发生了二次短路。大孔洞(直径D>90μm)面积和与熔珠横截面之比S/S'≈0.7时,发生二次短路的可能性大。The experimental samples of the first and second short-circuit copper melted beads were prepared and scanning electron microscopy (SEM) was used to study morphological characteristics of the internal holes by the method of qualitative and quantitative compare. The parameters describing holes characteristics were established, including pore diameter D, holes number density N and area ratio S/S'. The results show that the first short-circuit happens when holes number density N 〉 50 (~f~/mm2) by the condition of confidence probability 95 %. When area ratio between holes ( diameter of holes D 〈 90 μm) and cross-section of melted-bead is 0.8 (S/S) , the first short-circuit may be occur. The second short- circuit happens when pore diameter D 〉 170μm. When area ratio between holes (diameter of holes D 〉 90μm) and cross-section of melted-bead is 0.7(S/S') , the second short-circuit may be occur.

关 键 词:气孔直径D 孔洞数密度N 面积比S/S' 铜熔珠 

分 类 号:X928[环境科学与工程—安全科学]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象