基于量子元胞自动机的PLA故障分析和检测  

Fault Analysis and Detection of PLA Based on Quantum-Dot Cellular Automata

作　　者：李政操[1] 蔡理[1] 杨晓阔[1] 张明亮[1] 陈祥叶[1] 

机构地区：[1]空军工程大学理学院,西安710051

出　　处：《微纳电子技术》2012年第9期571-576,共6页Micronanoelectronic Technology

基　　金：国家自然科学基金(61172043);陕西省自然科学研究计划重点项目(2011JZ015)

摘　　要：量子元胞自动机(quantum-dot cellular automata,QCA)可编程逻辑阵列(programma-ble logic array,PLA)结构可用于实现大规模可编程逻辑电路。分析了4种故障类型发生在PLA单元的8个区域中的影响,得出了具体的影响效果。其中,直接或间接致使隐含线和与门发生逻辑错误的故障均会导致PLA中故障所在行整行失效,其他故障只会影响故障所在的PLA单元的逻辑功能和配置,而对PLA中的其他单元没有影响。此外,基于故障分析,提出了具体的PLA故障检测方法。The programmable logic array（PLA） structure based on quantum-dot cellular automata（QCA）can be used in large scale programmable logic circuit.Effects for four kinds of faults occuring in 8 districts of the PLA unit were analyzed,and concretely aftereffects were introduced.Faults leading the implicant wire and AND gate into the logic error directly or indirectly will invalidate the whole fault row of the PLA,the other faults will only influence the logic function and configuration of the PLA unit with faults,and have no effect on the other units of the PLA.Moreover,based on the fault analysis,a method for the fault detection of the PLA was presented.

关 键 词：量子元胞自动机(QCA) 可编程逻辑阵列(PLA) 故障分析 故障检测 逻辑电路 

分 类 号：O471.1[理学—半导体物理] TN4[理学—物理]