基于系统辨识和谐振峰聚焦快速测量Thiele-Small参数  

Quick Measurement of Thiele-Small Parameters Based on System Identification and Resonance Focusing

作　　者：余凯[1] 卢晶[1] 徐柏龄[1] 沈勇[1] 

机构地区：[1]南京大学声学研究所近代声学国家重点实验室,江苏南京210093

出　　处：《电声技术》2000年第7期14-17,共4页Audio Engineering

摘　　要：讨论了扬声器单元低频参数（Thiele－Small参数）的快速测量问题，提出了一种新的计算机测量方法，在系统辨识方法基础上利用一种频域上的聚焦搜索算法去除测量过程中不必要的冗余采样。实验表明该方法在测量速度和精度方面均取得令人满意的结果，适合于在线测量。The quick on-line measurement of the low frequency parameters, Thiele-small parameters is discussed. And a new computer-based method is introduced. The key idea is developing a focusable method to reduce the redundancy of sampling in frequency domain, combined with the system identification technology. Experiments have shown that the method performs successfully in both accuracy and testing speed, and it is suitable for on-line test.

关 键 词：扬声器 在线测量 系统辨识 谐振峰聚焦 

分 类 号：TN643.06[电子电信—电路与系统]